@InProceedings{ArmelinNaviDAmo:2018:PrAwFa,
author = "Armelin, F{\'a}bio Batagin and Naviner, Lirida A. B. and D'Amore,
Roberto",
affiliation = "{Instituto Nacional de Pesquisas Espaciais (INPE)} and
Tel{\'e}com ParisTech, COMELEC and {Instituto Tecnologico de
Aeron{\'a}utica (ITA)}",
title = "Probability aware fault-injection approach for SER estimation",
booktitle = "Proceedings...",
year = "2018",
pages = "1",
organization = "IEEE LatinAmerican Test Symposium, 19. (LATS)",
publisher = "IEEE",
abstract = "The Soft-Error Rate (SER) estimation is used to predict how
electronic systems will respond to the transient electrical pulses
induced by the ionizing radiation. SER estimation by radiation
test is an accurate method, but it is expensive and requires the
real device. Traditional simulation methods incorporate logical,
temporal and electrical masking effects while injecting faults at
the output of the device's functional elements. Nevertheless, they
do not consider the probability of the ionizing radiation to
produce a transient fault at the output of each class of
functional element. On the other hand, studies in the stochastic
computing domain deal with a probabilistic fault-injection
approach. Since many concomitant faults among the elements may
occur, the fault probability of each element is treated
independently. This leads to the use of one Pseudo-Random Number
Generator (PRNG) and a probability comparator for each functional
element. However, the analysis of a single fault is usually enough
for SER estimation. In this context, this work presents a
different approach for probability-aware fault-injection, in which
a weighted distribution of faults is defined considering the
relative fault probability of each functional element. This
approach enables the use of just one PRNG and a decoder for the
entire device, instead of a pair `PRNG-comparator' per element,
leading to a significant reduction in logic blocks consumption.
For the example analyzed in this study, the use of relative fault
probability decreases the number of logic blocks from 875
(adopting independent fault probability) to 495.",
conference-location = "Sao Paulo, SP",
conference-year = "12-14 mar.",
doi = "10.1109/LATW.2018.8349692",
url = "http://dx.doi.org/10.1109/LATW.2018.8349692",
isbn = "9781538614723",
label = "lattes: 9537412416816656 1 ArmelinNaviDAmo:2018:PrAwFa",
language = "en",
targetfile = "armelin_probability.pdf",
urlaccessdate = "28 abr. 2024"
}